Residual gas Ionization Profile Monitors (IPMs) are
used in the J-PARC 3-GeV RCS for the observation of
circulating transverse beam profile. In IPM system, the
ions and electrons produced by the beam passing through
chamber lead to Micro Channel Plate (MCP) by the
external electric field, and the signals from the MCP are
observed as the beam profile. The IPM system has an
upgrade plan for the optimization of the electric fields and
the observation of beam profile by the elections. This will
be reported the upgrade concept and status of the IPM.