Ionization Profile Monitors - IPM @ GSI

The Ionization Profile Monitor (IPM) in the SIS18 is
frequently used for machine development. The
permanent availability and the elaborated software user
interface make it easy and comfortable to use.
Additional to the beam profile data the device records
the data of synchrotron dc current, dipole ramp and
accelerating rf properties. The trend curves of these
data are shown correlated to the beam profile evolution
for an entire synchrotron cycle from injection to
extraction with 100 profiles/s. The reliable function is
based on the optimized in-vacuum hardware design,
and the UV-light based calibration system. The
permanent availability is based on the convenient
software interface using the Qt library. A new IPM
generation was recently commissioned in the
experimental storage ring (ESR) at GSI and another at
COSY at FZ-Jülich. These monitors are enhancements
of the heavy ion synchrotron (SIS18) multiwire IPM
but equipped with an especially developed large area
44x94 mm2 optical particle detector of rectangular
shape that is readout by a digital camera through a
viewport.

 

Published in: 
DIPAC2011
Authors: 
T. Giacomini, P. Forck, D. Liakin, J. Dietrich, G. v. Villiers,
Date: 
Monday, October 20, 2014
Type: 
conference paper

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